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Product Information

Data Communications

  • Suspensions
  • DSA
  • CLA
  • Top cover
  • Disk clamps
  • Test socket
  • Full wafer probe card
  • Wire spring/precision machine items
  • Lock hinge
  • Semiconductor Process Components
  • Integrated Metal Substrate
    ・Aluminum Substrates
    ・Steel Substrates
    ・Other Metal Substrates
  • Uses an independently developed, novel structure, precision probe
  • Characteristics of the NHK Spring probing unit
  • Full wafer probe card
  • Probe card for wafer scan
  • Test socket
  • Probe card for package TAB scan
  • SMT type burn-in socket
MC

  • Thin Leaf Springs
  • Precision Stamped Products

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