Computers and networking technologies these days continuously require higher and higher performance, larger capacities and increasing accuracy.
Microcontactor used in IC chip testers, wafer testers and electronic characteristic testers involve one of the world smallest springs, 70 microns in diameter.
NHK provides a wide variety of products for wafer testing, Final testing of Semiconductor, LCD testing, and TAB/Substrate testing.
Microcontactor provide high durability, superior production yield and support your testing.
Our Microcontactor,containing newly developed Glittertechnology,has high durability and superior production yield.
We produce best solution for testing by C.T.E.(Contorolled Testing Equipment) on 12inch FWLT PROBECARD and KELVIN Contact Probe & original NARROW pitch Probe.