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PROBE SPECS
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NHK has an unique design probe pin named "SocketpinŽ" for Wafer Level Test, Wafer Level Burn -In, and Final Test Socket.
<NHK Socketpin barrel-less design has a longer life>
  • In general, pogo pin has a barrel to support the plunger but in real application this plunger and barrel will eventually scrub each other and make it easy to wear.
  • NHK Socketpin does not have any barrel and the pin is nestled inside the socket housing directly.
  • The plunger will not scrub to the other metal material, this promotes a longer pin life.
<A better electrical characteristic>
  • NHK Socketpin consists an original coil spring design with has two portions.
  • The active (compressible) portion of the spring provides the force to contact.
  • The plunger is located inside the fixed portion of the spring that allows the electric current flowing thru a solid spring (as a short rod) nicely without any losses.
  • The electric current does not flow through the active coil.
  • This unique structure contributes greatly to a very low inductance (min of 0.6nH) and a very minimum insertion loss.
<Variety of the pin tip geometry, materials and tight pitch capability>
  • NHK has a wide variety of the pin tip geometry, materials and surface finished to fit the customer requirements.
  • NHK Socket pin is capable for 140um pin pitch application.