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Microcontactor was developed in 1989.
We introduced its first 0.3mm pitch double ended pipe less contactor for LCD test in 1992.
Our socketpin is now available for 140 um pitch probe, utilizing an ultra precision 78um diameter coil spring for semiconductor wafer, chip and package test.
Our main products are LCD Test unit, Test Socket, Wafer Probe Card (FWLT & WLBI) and Substrate Test unit using Microcontactor technology.
We produce major parts in-house with capability for custom designs to perfectly suit your needs & requests.
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